AnalyzeDirect Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia
Yoon U, Lee JM, Im K, Shin YW, Cho BH, Kim IY, Kwon JS, Kim SI. Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia. Neuroimage. February 2007;34(4):1405-1415. Publication Date February 2007 How Analyze was Used “Images were resampled to be isocubic and realigned so that the anterior–posterior axis of…