AnalyzeDirect Yoon U, Lee JM, Im K, Shin YW, Cho BH, Kim IY, Kwon JS, Kim SI. Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia. Neuroimage. February 2007;34(4):1405-1415.
Publication Date
February 2007
How Analyze was Used
“Images were resampled to be isocubic and realigned so that the anterior–posterior axis of the brain was aligned parallel to the intercommissural line and the other two axes were aligned along the interhemispheric fissure. The datasets were then filtered using an affine anisotropic diffusion filtering to improve the signal-to-noise ratio, which is a scale space, adaptive and the most widely used nonlinear technique for noise reduction. These procedures were processed using ANALYZE 4.0 software.”
Keywords
Adult
Aged
Aged, 80 and over
Cerebral Cortex/anatomy & histology/pathology
Discriminant Analysis
Female
Functional Laterality
Humans
Interviews as Topic
Male
Middle Aged
Schizophrenia/classification/pathology
Author Affiliation(s)
Department of Biomedical Engineering, Hanyang University, Sungdong PO Box 55, Seoul 133-605, Korea. (UY, J-ML, KI, BHC, IYK, SIK)
Department of Psychiatry, Seoul National University College of Medicine, Seoul, Korea. (Y-WS, JSK)
ID# 1771
Tags: Adult, Aged, Aged_80 and over, Cerebral Cortex/anatomy & histology/pathology, Discriminant Analysis, Female, Functional Laterality, Humans, Interviews as Topic, Male, Middle Aged, Schizophrenia/classification/pathology